Curve tracers are electronic test devices similar to oscilloscopes. They operate by varying a parameter then measuring a separate one to produce data for analysis referencing the characteristics of semiconductor instruments such as diodestransistors, and thyristors. Curve tracers feature time sampling, list sweep, and multichannel sweep functionality. They assist in semiconductor failure analysis as well as semiconductor device curve characterization.

Curve tracers possess numerous attributes, including:


  • Fully programmable operation
  • Waveform comparison and averaging
  • High-resolution parametric measurements
  • Built-in cursor measurements
  • List sweep
  • Direct third party printer hard copy functionality
  • Digital acquisition and display
  • Push-button source and measurement configuration
  • Time sampling